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Nonlinear least squares regression for single image scanning electron microscope signal‐to‐noise ratio estimation
Author(s) -
SIM K.S.,
NORHISHAM S.
Publication year - 2016
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12425
Subject(s) - interpolation (computer graphics) , mathematics , signal to noise ratio (imaging) , nonlinear regression , scanning electron microscope , noise (video) , optics , algorithm , statistics , artificial intelligence , computer science , image (mathematics) , regression analysis , physics
Summary A new method based on nonlinear least squares regression (NLLSR) is formulated to estimate signal‐to‐noise ratio (SNR) of scanning electron microscope (SEM) images. The estimation of SNR value based on NLLSR method is compared with the three existing methods of nearest neighbourhood, first‐order interpolation and the combination of both nearest neighbourhood and first‐order interpolation. Samples of SEM images with different textures, contrasts and edges were used to test the performance of NLLSR method in estimating the SNR values of the SEM images. It is shown that the NLLSR method is able to produce better estimation accuracy as compared to the other three existing methods. According to the SNR results obtained from the experiment, the NLLSR method is able to produce approximately less than 1% of SNR error difference as compared to the other three existing methods.