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Nanoscopic voltage distribution of operating cascade laser devices in cryogenic temperature
Author(s) -
DHAR R.S.,
BAN D.
Publication year - 2016
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12356
Subject(s) - nanoscopic scale , cascade , materials science , laser , optoelectronics , voltage , nanotechnology , optics , electrical engineering , physics , engineering , chemical engineering
Summary A nanoscopic exploratory measurement technique to measure voltage distribution across an operating semiconductor device in cryogenic temperature has been developed and established. The cross‐section surface of the terahertz (THz) quantum cascade laser (QCL) has been measured that resolves the voltage distribution at nanometer scales. The electric field dissemination across the active region of the device has been attained under the device's lasing conditions at cryogenic temperature of 77 K.