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Simulation of differential interference contrast microscopy and influence of aberrations
Author(s) -
ESSLINGER MORITZ,
GROSS HERBERT
Publication year - 2015
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12248
Subject(s) - differential interference contrast microscopy , condenser (optics) , optics , contrast (vision) , interference (communication) , differential (mechanical device) , point spread function , residual , physics , bright field microscopy , prism , microscopy , computer science , algorithm , telecommunications , light source , channel (broadcasting) , thermodynamics
We model differential interference contrast (DIC) for microscopes with residual aberrations. The model presented allows to predict the DIC performance of objectives directly from its bright field point spread function. We numerically simulate partially coherent illumination and discuss the influence of individual aberrations on the image quality. For the recently proposed PlasDIC setup, that comes without any condenser prism, we find that under coherent illumination the contrast reaches the performance of DIC. We present a rule for objective correction to drastically improve PlasDIC contrast also for partially coherent illumination.