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Toward structural/chemical cotailoring of phase‐change Ge–Sb–Te in a transmission electron microscope
Author(s) -
ZHANG W,
KIM J.G.,
ZHENG W.T.,
CUI X.Q.,
KIM Y.J.,
SONG S.A.
Publication year - 2015
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12216
Subject(s) - transmission electron microscopy , materials science , amorphous solid , nanoscopic scale , phase (matter) , electron microscope , electron , coupling (piping) , phase change , phase change memory , transmission (telecommunications) , microscope , thermal , optoelectronics , analytical chemistry (journal) , nanotechnology , crystallography , optics , chemistry , layer (electronics) , engineering physics , composite material , physics , thermodynamics , electrical engineering , engineering , chromatography , organic chemistry , quantum mechanics
Summary Ge 2 Sb 2 Te 5 , as the prototype material for phase‐change memory, can be transformed from amorphous phase into nanoscale rocksalt‐type GeTe provided with an electron irradiation assisted by heating to 520°C in a 1250 kV transmission electron microscope. This sheds a new light into structural and chemical cotailoring of materials through coupling of thermal and electrical fields.

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