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Very low energy electron microscopy of graphene flakes
Author(s) -
MIKMEKOVÁ E.,
BOUYANFIF H.,
LEJEUNE M.,
MÜLLEROVÁ I.,
HOVORKA M.,
UNČOVSKÝ M.,
FRANK L.
Publication year - 2013
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12049
Subject(s) - graphene , raman spectroscopy , materials science , transmission electron microscopy , scanning electron microscope , energy filtered transmission electron microscopy , electron microscope , microscopy , high resolution transmission electron microscopy , spectroscopy , resolution (logic) , electron energy loss spectroscopy , scanning transmission electron microscopy , nanotechnology , analytical chemistry (journal) , optics , chemistry , physics , composite material , quantum mechanics , artificial intelligence , computer science , chromatography
Summary Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.