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Developing the Chinese Environmentally Extended Input‐Output (CEEIO) Database
Author(s) -
Liang Sai,
Feng Tiantian,
Qu Shen,
Chiu Anthony S.F.,
Jia Xiaoping,
Xu Ming
Publication year - 2017
Publication title -
journal of industrial ecology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.377
H-Index - 102
eISSN - 1530-9290
pISSN - 1088-1980
DOI - 10.1111/jiec.12477
Subject(s) - database , china , benchmark (surveying) , transparency (behavior) , computer science , environmental resource management , environmental science , geography , computer security , archaeology , geodesy
Summary Environmentally extended input‐output (EEIO) databases are increasingly used to examine environmental footprints of economic activities. Studies focusing on China have independently, repeatedly developed EEIO databases for China. These databases are usually not publicly available, leading to repeated efforts, inconsistent with one another using different approaches, of limited environmental accounts, and lacking transparency, preventing continuous updating. We developed a transparent, comprehensive, and consistent Chinese EEIO database covering a wide period of time (currently 1992, 1997, 2002, and 2007 for which benchmark input‐output tables [IOTs] are available), sector classifications (original sector classifications in benchmark IOTs, a 45‐sector classification commonly used in China's environmental and energy statistics, and a 91‐sector classification with maximized sector resolution ensuring temporal consistence), and environmental satellite accounts for 256 types of resources and 30 types of pollutants in this study. Moreover, the environmental satellite accounts cover households in addition to sectors, allowing developing closed models. We make this database publicly available with open access for broader dissemination ( www.ceeio.com ). We demonstrate the database by evaluating environmental pressures of Chinese products in 2007. Comparisons of our database with previous studies validate its rationality and reliability.