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In situ defect quantification and phase identification during flash sintering using Raman spectroscopy
Author(s) -
Murray Shan E.,
Lv Guangxin,
Sulekar Soumitra S.,
Cahill David G.,
Shoemaker Daniel P.
Publication year - 2021
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.17807
Subject(s) - sintering , raman spectroscopy , materials science , flash (photography) , phase (matter) , analytical chemistry (journal) , in situ , characterization (materials science) , electric field , vacancy defect , thermal , chemical engineering , nanotechnology , composite material , crystallography , chemistry , thermodynamics , optics , engineering , chromatography , quantum mechanics , physics , organic chemistry
Flash sintering has been established as a method to rapidly densify or induce phase transformation in materials by applying an electric field. Understanding rapid transformations is challenging in a laboratory setting, where phase and defect populations may change with sub‐second time scales. In this work, we apply in situ Raman spectroscopy to investigate defect complexes and phase transformations during flash sintering. We demonstrate that the oxygen vacancy complexes in Ce 0.85 Gd 0.15 O 1.925 and the evolving phases in a SrCO 3 + V 2 O 5 reaction can be probed with acquisition times sufficient to monitor stage II of flash sintering. We establish how thermal effects can be separated from effects of the electric field and determine the resolution of the defect concentration. The fast characterization we demonstrate here can be combined with well‐developed models of thermal and phase evolution to elucidate the mechanism of densification during flash sintering.