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Issue Information
Publication year - 2020
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.16579
Subject(s) - fluence , beam (structure) , octahedron , ion , scattering , cover (algebra) , irradiation , optics , ion beam , materials science , x ray , physics , nuclear physics , mechanical engineering , quantum mechanics , engineering
Cover Photograph: Small angle X‐ray scattering images of MgAl 2 O 4 irradiated by swift heavy ions (SHI) of 100 MeV Xe to a fluence of 1 × 1013 cm –2 . (a) The sample was set with the X‐ray beam incident parallel to the direction of SHI irradiation, whereas (b‐d) the sample was tilted to 1°, 5°, and 15°, respectively, with respect to the X‐ray beam. The two vertical lines and central spot without intensities visible in each image are gaps due to the detector module edge and the catcher for the incident X‐ray beam, respectively. Analyses on these images showed that the defects induced by the SHIs were cylindrical shape ones (ion tracks) with a diameter of 5.1±1.4 nm, and that cations at tetrahedral and octahedral sites inside the ion tracks were significantly disordered. Cover Credit: Satoru Yoshioka, Kyushu University. DOI; 10.1111/jace.17101 .2019 ACerS Ceramographic Exhibit & Competition Category: Underrgraduate, 2 nd Place