Premium
The spectra analysis and microwave dielectric properties of [Ca 0.55 (Sm 1‐x Bi x ) 0.3 ]MoO 4 ceramics
Author(s) -
Hao ShuZhao,
Zhou Di,
Pang LiXia
Publication year - 2019
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.16339
Subject(s) - scheelite , analytical chemistry (journal) , temperature coefficient , tetragonal crystal system , ceramic , atmospheric temperature range , sintering , microwave , dielectric , raman spectroscopy , materials science , phase (matter) , spectral line , permittivity , mineralogy , chemistry , metallurgy , optics , tungsten , thermodynamics , optoelectronics , physics , organic chemistry , chromatography , quantum mechanics , astronomy , composite material
Abstract A series of low‐temperature firing ceramics with scheelite structure, [Ca 0.55 (Sm 1‐x Bi x ) 0.3 ]MoO 4 ( x = 0.2–0.95), were prepared via solid‐state reaction. The sintering temperature ranges from 660 to 760°C. A standard tetragonal scheelite phase was formed without secondary phase. When the x value was 0.95, the temperature coefficient of resonant frequency ( τ f ) moved to a near zero value (−2.1 ppm/°C) with a dielectric constant 13.7 and the quality factor (Qf) of 33 200 GHz. The Raman spectra shows that the more vibration modes appeared with x value, which is due to the increasing of Bi concentration and results in increase in permittivities and decrease in Qf values. The classical harmonic oscillator model is used in the infrared spectra and extrapolate to the microwave range. The [Ca 0.55 (Sm 1‐x Bi x ) 0.3 ]MoO 4 ceramics show high‐performance microwave dielectric properties at low‐sintering temperature.