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Textured dense zinc oxide layers for active noise canceling windows
Author(s) -
Lüchtenborg Jörg,
Kober Delf,
Weber Alfred P.,
Melcher Jörg,
Günster Jens
Publication year - 2019
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.15928
Subject(s) - zinc , materials science , wafer , scanning electron microscope , texture (cosmology) , oxide , transparent conducting film , chemical deposition , annealing (glass) , chemical engineering , mineralogy , composite material , analytical chemistry (journal) , electrical conductor , optics , optoelectronics , metallurgy , chemistry , image (mathematics) , artificial intelligence , computer science , engineering , physics , chromatography
Dense ZnO films with a strong c ‐axis texture have been deposited on transparent conductive oxide glass, glass, and Si wafers, respectively, with a two‐step pressureless wet chemical method using zinc acetate dihydrate as Zn‐precursor. The crystallographic structure of the films has been studied with XRD and scanning electron microscopy. Optical measurements reveal a high transparency of the ZnO films with a thickness of up to 10 μm. This new cost‐effective route for ZnO film deposition does not require expensive sophisticated equipment and is easily upscaled.