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Effects of the deep traps on the thermal‐stability property of CaAl 2 O 4 : Eu 2+ phosphor
Author(s) -
Liu Zhichao,
Zhao Lei,
Chen Wenbo,
Xin Shuangyu,
Fan Xiaotong,
Bian Wenjuan,
Yu Xue,
Qiu Jianbei,
Xu Xuhui
Publication year - 2018
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.15532
Subject(s) - phosphor , thermal stability , luminescence , materials science , doping , thermal , quenching (fluorescence) , diode , optoelectronics , mineralogy , analytical chemistry (journal) , chemistry , optics , fluorescence , thermodynamics , physics , organic chemistry , chromatography
The thermal quenching properties and mechanisms of phosphors employed in white light emitting diodes ( wLED s) are critical for their commercial application. Here, we attempted to characterize the deep traps for capturing and releasing carriers to improve the thermal stability of the blue‐emitting CaAl 2 O 4 : Eu 2+ , Tm 3+ phosphors. The enhanced thermal stability contributed to the introduction of traps has been demonstrated, and the mechanism of the transport process of carriers, has been explored in detail. In comparison with Eu 2+ doped sample, the co‐doped Tm 3+ samples bring more deep traps. The releasing of carriers in deep traps therefore sustains the luminescence with increasing temperature and compensates the thermal luminescence intensity loss. The results provide a theoretical basis and new field of view for exploring excellent thermal stability phosphors for wLED s.