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Bismuth niobate thin films for dielectric energy storage applications
Author(s) -
Wang Dixiong,
Clark Michael B.,
TrolierMcKinstry Susan
Publication year - 2018
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.15517
Subject(s) - x ray photoelectron spectroscopy , thin film , materials science , bismuth , carbon fibers , dielectric , analytical chemistry (journal) , pyrolysis , chemistry , optoelectronics , chemical engineering , nanotechnology , composite material , metallurgy , organic chemistry , chromatography , composite number , engineering
Low‐temperature processed bismuth niobate ( BNO ) thin films were explored in this work as a potential candidate for high‐energy density capacitors. The BNO samples were fabricated by the chemical solution deposition method followed by a series of ultraviolet ( UV ) exposure and heat treatments. A UV treatment prior to the final pyrolysis step was found to be useful in eliminating bound carbon. X‐ray photoelectron spectroscopy ( XPS ) and secondary ion mass spectroscopy ( SIMS ) demonstrated that the residual carbon could be effectively removed at 350°C after UV exposure. Following a heat treatment at 450°C, the energy storage density of the BNO thin film reached 39 J/cm 3 with an efficiency of 72%. Furthermore, 350°C and 375°C treated BNO samples showed high‐temperature stability such that the efficiencies of the films remained above 97% up to 150°C at 10 kH z under 1 MV /cm applied field.