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Dielectric relaxation and electrical conduction in (Bi x Na 1− x ) 0.94 Ba 0.06 TiO 3 ceramics
Author(s) -
Li Xiaojuan,
Jing Qi,
Xi Zengzhe,
Liu Peng,
Long Wei,
Fang Pinyang
Publication year - 2018
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.15270
Subject(s) - dielectric , thermal conduction , activation energy , electrical resistivity and conductivity , relaxation (psychology) , materials science , analytical chemistry (journal) , ion , oxide , ceramic , conductivity , ionic conductivity , condensed matter physics , chemistry , electrode , electrical engineering , optoelectronics , psychology , social psychology , physics , organic chemistry , chromatography , electrolyte , metallurgy , composite material , engineering
The dielectric relaxation and electrical conduction were investigated in (Bi x Na 1− x ) 0.94 Ba 0.06 TiO 3 (Abb. x BNBT6, x = 0.5, 0.495, 0.485, and 0.475) ceramics prepared by solid state reaction. With a decrease in x , the dielectric properties of the ceramics decreased, whereas the electrical conduction increased, resulting in a transition from insulator to oxide‐ions conductor. When x = 0.475, the ceramics exhibited large conductivity (~10 −3 S cm −1 at 575°C) and low activation energy (~0.45 eV), indicating their potential application in solid oxide fuel cells. A mixed conduction mechanism with oxide‐ions, electrons, and holes was proposed. With a decrease in x from 0.495 to 0.475, it was found that the p ‐type conduction was switched to n ‐type conduction. The dielectric relaxation of the x = 0.495 sample was associated with short‐range hopping of oxygen vacancies. However, the dielectric properties of the x = 0.485 and 0.475 samples can be explained by Maxwell‐Wagner interface relaxation.