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Scaling Effects in Sodium Zirconium Silicate Phosphate (Na 1+ x Z r 2 Si x P 3− x O 12 ) Ion‐Conducting Thin Films
Author(s) -
Ihlefeld Jon F.,
Gurniak Emily,
Jones Brad H.,
Wheeler David R.,
Rodriguez Mark A.,
McDaniel Anthony H.
Publication year - 2016
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.14285
Subject(s) - ionic conductivity , zirconium , crystallite , silicon , conductivity , analytical chemistry (journal) , materials science , sodium , grain boundary , ionic bonding , inorganic chemistry , silicate , ion , mineralogy , microstructure , chemistry , metallurgy , electrolyte , organic chemistry , electrode , chromatography
Preparation of sodium zirconium silicate phosphate (Na SIC on), Na 1+ x Z r 2 Si x P 3− x O 12 (0.25 ≤ x ≤ 1.0), thin films has been investigated via a chemical solution approach on platinized silicon substrates. Increasing the silicon content resulted in a reduction in the crystallite size and a reduction in the measured ionic conductivity. Processing temperature was also found to affect microstructure and ionic conductivity with higher processing temperatures resulting in larger crystallite sizes and higher ionic conductivities. The highest room temperature sodium ion conductivity was measured for an x = 0.25 composition at 2.3 × 10 −5 S/cm. The decreasing ionic conductivity trends with increasing silicon content and decreasing processing temperature are consistent with grain boundary and defect scattering of conducting ions.