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Structure, Infrared Reflectivity and Microwave Dielectric Properties of (Na 0.5 La 0.5 )MoO 4 –(Na 0.5 Bi 0.5 )MoO 4 Ceramics
Author(s) -
Li WenBo,
Zhou Di,
Xi HaiHong,
Pang LiXia,
Yao Xi
Publication year - 2016
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.14175
Subject(s) - temperature coefficient , analytical chemistry (journal) , materials science , tetragonal crystal system , permittivity , relative permittivity , dielectric , microwave , ceramic , sintering , scheelite , microstructure , mineralogy , infrared spectroscopy , chemistry , crystal structure , crystallography , metallurgy , tungsten , composite material , physics , optoelectronics , chromatography , quantum mechanics , organic chemistry
A series of temperature‐stable microwave dielectric ceramics, (1− x )(Na 0.5 La 0.5 )MoO 4 – x (Na 0.5 Bi 0.5 )MoO 4 (0.0 ≤ x ≤ 1.0) were prepared by using solid‐state reaction. All specimens can be well sintered at temperature of 580°C–680°C. Sintering behavior, phase composition, microstructures, and microwave dielectric properties of the ceramics were investigated. X‐ray diffraction results indicated that tetragonal scheelite solid solution was formed. Microwave dielectric properties showed that permittivity (ε r ) and temperature coefficient of resonant frequency (τ f ) were increased gradually, while quality factor ( Q × f ) values were decreased, at the x value was increased. The 0.45(Na 0.5 La 0.5 )MoO 4 –0.55(Na 0.5 Bi 0.5 )MoO 4 ceramic sintered at 640°C with a relative permittivity of 23.1, a Q × f values of 17 500 GH z (at 9 GH z) and a near zero τ f value of 0.28 ppm/°C. Far‐infrared spectra (50–1000 cm −1 ) study showed that complex dielectric spectra were in good agreement with the measured microwave permittivity and dielectric losses.