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Lattice and Grain‐Boundary Diffusion of Al in Tetragonal Yttria‐Stabilized Zirconia Polycrystalline Ceramics (3 Y‐TZP ) Analyzed Using SIMS
Author(s) -
Kowalski Kazimierz,
Obal Katarzyna,
Pedzich Zbigniew,
Schneider Krystyna,
Rekas Mieczyslaw
Publication year - 2014
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.13126
Subject(s) - materials science , yttria stabilized zirconia , crystallite , tetragonal crystal system , cubic zirconia , grain boundary , grain boundary diffusion coefficient , ceramic , lattice diffusion coefficient , diffusion , grain size , crystallography , mineralogy , chemical engineering , analytical chemistry (journal) , composite material , metallurgy , effective diffusion coefficient , chemistry , microstructure , crystal structure , thermodynamics , medicine , physics , chromatography , magnetic resonance imaging , radiology , engineering
Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3 Y‐TZP ). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by secondary ion mass spectroscopy. The experimental results for the lattice diffusion (D B ) and grain boundary diffusion (D GB ) are as follows:D B = 6.5 × 10 5exp− 590 kJ molR T[cm 2 s ]andD GB δ s = 2.6 × 10 5exp− 675 kJ molR T[cm 3 s ]where δ is the grain‐boundary width and s is the segregation factor.