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Dielectric Properties and Relaxation of Bi 2 Ti 2 O 7
Author(s) -
Turner Christopher G.,
EsquivelElizondo J. Roberto,
Nino Juan C.
Publication year - 2014
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.12803
Subject(s) - activation energy , dielectric , pyrochlore , relaxation (psychology) , arrhenius equation , materials science , ceramic , analytical chemistry (journal) , bismuth , mineralogy , chemistry , phase (matter) , composite material , psychology , social psychology , optoelectronics , organic chemistry , chromatography , metallurgy
The dielectric properties of Bi 2 Ti 2 O 7 were explored as a function of temperature and frequency. A comparison between the dielectric response of the well‐known Bi 1.5 Zn 0.92 Nb 1.5 O 6.92 ( BZN ) pyrochlore and the recently available Bi 2 Ti 2 O 7 sintered ceramic revealed considerable differences, which indicate that chemical disorder, and not atomic displacement on its own, is chiefly responsible for the dielectric relaxation in bismuth pyrochlores. A low‐frequency (<10 kHz) and relatively high‐temperature (~125 K) dielectric relaxation was observed in Bi 2 Ti 2 O 7 . An Arrhenius function was used to model the relaxation behavior and yielded an activation energy of 0.162 eV and an attempt jump frequency of ~1 MHz. This response is consistent with space charge polarization and not the result of dipolar or ionic disorder.