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Dielectric Properties and Impedance Analysis of K 0.5 Na 0.5 NbO 3 – Ba 2 NaNb 5 O 15 Ceramics with Good Dielectric Temperature Stability
Author(s) -
Chen Xiuli,
Wang Yiliang,
Chen Jie,
Zhou Huanfu,
Fang Liang,
Liu Laijun
Publication year - 2013
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.12514
Subject(s) - natural bond orbital , analytical chemistry (journal) , orthorhombic crystal system , dielectric , materials science , dielectric spectroscopy , relaxation (psychology) , chemistry , crystal structure , crystallography , electrochemistry , molecule , chromatography , optoelectronics , organic chemistry , electrode , psychology , social psychology
(1− x )( K 0.5 Na 0.5 ) NbO 3 – x Ba 2 NaNb 5 O 15 [(1− x ) KNN – x BNN , 0 ≤ x ≤0.1] ceramics were prepared by solid‐state reaction method. X‐ray diffraction analysis of the ceramics revealed that the crystal structure changed from orthorhombic to rhombohedral with increasing BNN content. Dielectric measurement showed that the ceramics exhibited good dielectric temperature stability over a wide temperature range. Basic mechanisms of the conduction and relaxation processes have been investigated using impedance spectroscopy analyses. It was concluded that the conduction and relaxation processes were thermally activated and oxygen vacancies were the possible ionic charge carriers at higher temperatures.