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Exceptionally High Dielectric Constant in Ceramic Pr 2 CuO 4
Author(s) -
Salame Paresh H.,
Prakash Om,
Kulkarni A. R.
Publication year - 2013
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.12306
Subject(s) - dielectric , ceramic , materials science , rietveld refinement , cuprate , analytical chemistry (journal) , scanning electron microscope , lattice constant , diffraction , power law , superconductivity , dissipation factor , conductivity , condensed matter physics , mineralogy , crystal structure , crystallography , chemistry , optics , composite material , physics , optoelectronics , statistics , mathematics , chromatography
The pristine layered cuprate Pr 2 CuO 4 samples of >95% density were fabricated as thin disks. The samples, analyzed by X ‐ray diffraction and Scanning electron microscopy, showed clean T′‐type phase with Rietveld refined lattice parameters a = b = 3.95805(±5) Å and c = 12.2262(±5) Å. The measured dielectric properties of the Pr 2 CuO 4 ceramics, in the temperature range −100°C–150°C and frequencies (ν) 0.1 Hz–1 MHz, showed extremely high ε r ′ > 10 4 (above −30°C), and dissipation (tan δ = ε r ′′/ε r ′) between 0.1 and 5 (for 500 Hz ≤ ν ≤ 1 MHz, and −100 ≤ T ≤ 150°C). The ac conductivity of Pr 2 CuO 4 ceramics ranged between 10 −6 and 10 −3 Scm −1 for the measured frequencies and temperatures, and showed frequency‐dependent double power law behavior akin to a modified Jonscher's power law.