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Probing the Conductance and Microstructure Heterogeneity of Si 3 N 4 / TiC ‐Based Nanocomposite at the Nanoscale by Scanning Impedance Microscopy
Author(s) -
Lee Alex C.,
Su PoJui,
Liu Bernard H.
Publication year - 2013
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/jace.12282
Subject(s) - materials science , spark plasma sintering , nanocomposite , microstructure , electrowetting , transmission electron microscopy , sintering , conductance , phase (matter) , capacitance , nanotechnology , composite material , electrode , optoelectronics , chemistry , organic chemistry , dielectric , mathematics , combinatorics
This study presents the results of atomic force microscopy ( AFM )‐localized impedance measurements within Si 3 N 4 /glassy phase/ TiC heterogeneous nanostructures. The three phases show significant differences in the charge‐transfer resistance and interface capacitance values detected on the plasma‐etching surface by an ultrasharp AFM , and these characteristics are helpful to understand the sintering behavior in spark plasma sintering. The effect of an electrical field may induce localized Joule heating on conductive nano‐ TiC embedded in the Si 3 N 4 ‐based matrix. The glassy phase doped with Ti and C , as observed by transmission electron microscopy, may promote electrowetting, leading to enhanced densification in the insulating/conductive ceramic nanocomposite system.