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Some comments on the technical acceptability of Warrington's Recognition Memory Test
Author(s) -
Kapur Narinder
Publication year - 1987
Publication title -
british journal of clinical psychology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.479
H-Index - 92
eISSN - 2044-8260
pISSN - 0144-6657
DOI - 10.1111/j.2044-8260.1987.tb00741.x
Subject(s) - psychology , test (biology) , reliability (semiconductor) , documentation , memory test , recognition memory , neuropsychological test , neuropsychology , psychometrics , cognitive psychology , developmental psychology , cognition , computer science , psychiatry , paleontology , physics , quantum mechanics , biology , power (physics) , programming language
The technical merits of Warrington's Recognition Memory Test are reviewed. The test has a number of attractive features, but also a number of significant limitations including defects in the initial validation studies, ceiling effects for the verbal recognition memory test, and inadequate documentation of the effects of educational level so as to permit interpretation of individual test data. In addition, no reliability data, such as test‐retest or inter‐examiner reliability correlations, are reported. It is suggested, therefore, that in its present form the test has limitations as an instrument for use in routine neuropsychological assessment.