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Correlation between crystallographic structure and infrared spectra of silicon oxide films containing iron or magnesium atoms
Author(s) -
SUZUKI N.,
KIMURA S.,
NAKADA T.,
KAITO C.,
SAITO Y.,
KOIKE C.
Publication year - 2000
Publication title -
meteoritics and planetary science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.09
H-Index - 100
eISSN - 1945-5100
pISSN - 1086-9379
DOI - 10.1111/j.1945-5100.2000.tb01515.x
Subject(s) - infrared spectroscopy , impurity , infrared , amorphous solid , spectral line , silicate , magnesium , analytical chemistry (journal) , silicon , materials science , oxide , metal , crystallography , chemistry , metallurgy , optics , physics , organic chemistry , chromatography , astronomy
— Films condensed from vapors containing SiO, Fe, or Mg showed an amorphous structure. Infrared (IR) spectra and electron microscopic characterization have been carried out on these films. After the heat treatment of these films in air, IR peaks at approximately 18–23 μm appeared, in addition to peaks attributable to SiO 2 . These peaks can be attributed to metallic oxides such as FeO, Fe 2 O 3 , and MgO. It can be concluded that Fe‐ or Mg‐bearing silicate minerals cannot be produced by the rapid cooling of SiO, Fe, or Mg vapors. Although IR spectra of FeO have been discussed in order to match some spectra obtained with the Infrared Space Observatory, the identification of FeO as the impurity would be very important because the IR spectra of FeO grains are very dependent on the shape and size of the grains. These impurities can also influence the IR spectral feature of SiO 2 .