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BENCHMARKING MANUFACTURING PERFORMANCE IN THE SEMICONDUCTOR INDUSTRY
Author(s) -
BENSON ROBERT F.,
CUNNINGHAM SEAN P.,
LEACHMAN ROBERT C.
Publication year - 1995
Publication title -
production and operations management
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.279
H-Index - 110
eISSN - 1937-5956
pISSN - 1059-1478
DOI - 10.1111/j.1937-5956.1995.tb00052.x
Subject(s) - benchmarking , metric (unit) , semiconductor industry , semiconductor device fabrication , performance metric , manufacturing , performance measurement , measure (data warehouse) , manufacturing engineering , business , organizational performance , operations management , computer science , industrial engineering , marketing , engineering , data mining , electrical engineering , wafer
A methodology for benchmarking manufacturing practices in the worldwide semiconductor industry is presented. Several metrics for measuring semiconductor manufacturing performance are defined and discussed. Interviews conducted during site visits are used to identify the managerial, technical, and organizational practices underlying superior metric performance. Multivariate statistical analyses of the performance metric data indicate that these performance metrics measure independent aspects of performance and expose significant performance differences among fabs.