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Electron Microscopy after the Application of Lanthanum as Tracer Particles and Ionic Stain
Author(s) -
DAVANGER MARTIN
Publication year - 1980
Publication title -
acta ophthalmologica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.534
H-Index - 87
eISSN - 1755-3768
pISSN - 1755-375X
DOI - 10.1111/j.1755-3768.1980.tb08292.x
Subject(s) - lanthanum , exfoliation joint , tracer , electron microscope , ionic bonding , matrix (chemical analysis) , scanning electron microscope , chemistry , ionic strength , materials science , analytical chemistry (journal) , ion , composite material , nanotechnology , chromatography , inorganic chemistry , optics , aqueous solution , physics , graphene , organic chemistry , nuclear physics
Lenses with pseudo‐exfoliation (PE) were suspended in a solution of lanthanum, which was present partly in ionic form, partly as electron‐dense tracer particles in colloidal solution, dependent on pH and on the concentration of lanthanum, By electron microscopy the tracer particles were found in a narrow zone along the surface of the PE excrescences. Only a few of the smallest particles had penetrated into their most superficial layer. In the specimens treated with ionic lanthanum, the effect was an electron‐dense staining of the PE material within a 1–2 μm thick superficial layer. The PE fibrils as well as parts of the interfibrillar spaces were stained. These results indicate the presence of proteoglycans, and confirm the concept of an interfibrillar matrix which excludes other macromolecules and particles from penetrating into the material.

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