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A Synthetic Germanium‐Bismuth Glass for the Coarse Mass Calibration of SIMS Instruments
Author(s) -
Wiedenbeck Michael,
Schulze Dina,
Veksler Ilya
Publication year - 2009
Publication title -
geostandards and geoanalytical research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.037
H-Index - 73
eISSN - 1751-908X
pISSN - 1639-4488
DOI - 10.1111/j.1751-908x.2009.00898.x
Subject(s) - calibration , table (database) , bismuth , mass spectrometry , analytical chemistry (journal) , secondary ion mass spectrometry , range (aeronautics) , germanium , high mass , calibration curve , materials science , mineralogy , chemistry , process engineering , computer science , metallurgy , physics , detection limit , database , environmental chemistry , composite material , engineering , chromatography , quantum mechanics , silicon , astrophysics
This short technical note describes a simple technique for synthesising an optimised binary glass for performing coarse mass table calibrations of secondary ion mass spectrometers. A Ge‐Bi glass doped with five selected trace elements was used to anchor the entire mass table up to m/z ≥ 209 at an accuracy of < 0.5 dalton. Using this material it has been possible to calibrate coarsely the mass table of a Cameca ims 6f instrument in less than five minutes, thereby greatly simplifying the switch from low mass range to high mass range measurements. Although not suitable for the quantification of geological materials, the ease of synthesis and its utility for rapidly performing what is an otherwise time consuming process makes this material a useful tool for SIMS instruments which offer a multiple mass range capability.