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Synthetic Silica Glass for Trace Aluminium Determination in Quartz by Electron Microprobe
Author(s) -
Miyoshi Naoya,
Satoh Hisao,
Yamaguchi Yoshiaki,
Masuda Harue
Publication year - 2003
Publication title -
geostandards newsletter
Language(s) - English
Resource type - Journals
eISSN - 1751-908X
pISSN - 0150-5505
DOI - 10.1111/j.1751-908x.2003.tb00714.x
Subject(s) - aluminium , electron microprobe , quartz , microprobe , calibration , materials science , calibration curve , analytical chemistry (journal) , mineralogy , trace amounts , metallurgy , chemistry , detection limit , chromatography , physics , medicine , alternative medicine , pathology , quantum mechanics
Five synthetic silica glasses have been prepared for microprobe determination of trace aluminium in quartz. The glasses were synthesized from tetraethoxysilane (TEOS) into which between 0 and 1431 μg g‐ 1 aluminium had been doped. The aluminium concentrations of the glasses were independently determined by ICP‐AES analysis. X‐ray wavelength shift in the Al Kα peak was minimised relative to unknown quartz samples when these glasses were used for calibration. A set of these five glasses yielded a linear calibration line, and are available for trace aluminium analysis of quartz in routine microprobe systems.