z-logo
Premium
Comparison of UV and IR Laser Ablation ICP‐MS on Silicate Reference Materials and Implementation of Normalisation Factors for Quantitative Measurements
Author(s) -
MotelicaHeino Mikael,
Donard Olivier F.X.
Publication year - 2001
Publication title -
geostandards newsletter
Language(s) - English
Resource type - Journals
eISSN - 1751-908X
pISSN - 0150-5505
DOI - 10.1111/j.1751-908x.2001.tb00611.x
Subject(s) - laser , matrix (chemical analysis) , silicate , laser ablation , materials science , wavelength , ablation , analytical chemistry (journal) , optics , chemistry , optoelectronics , environmental chemistry , composite material , physics , organic chemistry , engineering , aerospace engineering
Direct analysis of geological reference materials was performed by LA‐ICP‐MS using two Nd:YAG laser systems operating at 266 nm and 1064 nm. The aim of this work was to compare UV and IR laser ablation and to assess the potential of the technique for the quantitative bulk analysis of rocks, sediments and soils. The laser sampling process was investigated and the analytical performance of both systems was compared. The influence of the laser operating conditions and the nature of the matrix on ICP‐MS response factors calculated for major, minor and trace elements was evaluated. Under consistent laser settings, the response factors appeared to be matrix dependent. For a given matrix, the response factors were also significantly different for the two lasers. Normalisation with a single matrix element was effective only for matrices with similar mineralogy. When operating at 266 nm instead of 1064 nm, matrix effects could be reduced but not overcome. However, variations of the response factors between the different matrices appeared to be similar within distinct groups of elements, reflecting geochemical associations. When using multiple internal standards, matrix effects but also effects of the laser wavelength, could be fully compensated.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here