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Determination of Nickel in GSJ Standard Rock Samples Using Secondary Ion Mass Spectrometry
Author(s) -
YURIMOTO Hisayoshi,
SAKAGUCHI Isao,
NISHIDA Norimasa,
SUENO Shigeho
Publication year - 1991
Publication title -
geostandards newsletter
Language(s) - English
Resource type - Journals
eISSN - 1751-908X
pISSN - 0150-5505
DOI - 10.1111/j.1751-908x.1991.tb00108.x
Subject(s) - secondary ion mass spectrometry , silicate glass , ion , analytical chemistry (journal) , nickel , mass spectrometry , silicate , chemistry , mineralogy , chromatography , organic chemistry
Trace level determination of nickel in silicate rock samples has been achieved using secondary ion mass spectrometry (SIMS) with kinetic energy filtering. Standard rock references, issued by the Geological Survey of Japan, were fused into glass and used as standards for the SIMS analysis. Due to interferences from the glass matrix, the secondary ion of mass 60 was only useful for Ni, although the secondary ion was interfered mainly by CaO+. The contributions of these molecular ions were deconvolved by a least squares regression. Good linear correlation between results after the deconvolution and the Ni concentration in the glass standards was obtained. The uncertainties of the SIMS analysis depend strongly on the degree of contribution of CaO+ molecular ion. Such a method of SIMS analysis is especially useful to study the detailed behavior of Ni on a micro‐scale in Ca‐poor materials.