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THE OPTICAL PROPERTIES OF ADENINE FROM 1.8 TO 80 eV *
Author(s) -
Arakawa E. T.,
Emerson L. C.,
Juan S. I.,
Ashley J. C.,
Williams M. W.
Publication year - 1986
Publication title -
photochemistry and photobiology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.818
H-Index - 131
eISSN - 1751-1097
pISSN - 0031-8655
DOI - 10.1111/j.1751-1097.1986.tb04674.x
Subject(s) - photon energy , refractive index , electron , valence (chemistry) , photon , atomic physics , chemistry , dielectric function , dielectric , 3d optical data storage , consistency (knowledge bases) , valence electron , physics , optics , quantum mechanics , geometry , mathematics , organic chemistry
Experimental measurements of the optical reflectance of solid adenine films have been obtained for photon energies extending from 1.8 to 80 eV. From these data we have established the complex index of refraction, the complex dielectric function, and the energy‐loss function Im(‐l/). Structure in the dielectric functions are ascribed to * transitions at photon energies less than ~9 eV and to * transitions at higher energies. A broad peak in the energy‐loss function near 24 eV is associated with a collective resonance involving all the valence electrons. Sum rule calculations are used to demonstrate the overall consistency of the data.