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SYSTEMATIC ERRORS DUE TO EXCITATION PULSE WIDTH IN FAST KINETIC TECHNIQUES
Author(s) -
Duddell D. A.
Publication year - 1980
Publication title -
photochemistry and photobiology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.818
H-Index - 131
eISSN - 1751-1097
pISSN - 0031-8655
DOI - 10.1111/j.1751-1097.1980.tb03694.x
Subject(s) - pulse (music) , excitation , convolution (computer science) , kinetic energy , transient (computer programming) , spectral width , atomic physics , absorbance , physics , exponential decay , optics , mathematics , computational physics , wavelength , quantum mechanics , computer science , machine learning , artificial neural network , operating system , detector
— Convolution of the decay function with the excitation pulse function leads to systematic error in both kinetic and spectral analysis of transients. The error in rate constant determination for a first order decay can be kept to about 1% if the decay half‐life is equal to the pulse half‐width and to well below 1% for half‐lives equal to or longer than twice the half‐width. The errors in transient absorbance measurements are much greater. Only if the half‐life approaches 200 times the pulse half‐width is the error reduced to 1%. It is suggested that spectral measurements should be corrected for this error.