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Focused Impedance Measurement (FIM): A New Technique with Improved Zone Localization
Author(s) -
RABBANI K. S.,
SARKER M.,
AKOND M. H. R.,
AKTER T.
Publication year - 1999
Publication title -
annals of the new york academy of sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.712
H-Index - 248
eISSN - 1749-6632
pISSN - 0077-8923
DOI - 10.1111/j.1749-6632.1999.tb09490.x
Subject(s) - electrical impedance , electrical impedance tomography , sensitivity (control systems) , conductor , dead zone , electrode , acoustics , computer science , materials science , geology , electronic engineering , physics , electrical engineering , engineering , oceanography , quantum mechanics , composite material
A bstract : Conventional four‐electrode impedance measurements (FEIM) cannot localize a zone of interest in a volume conductor. On the other hand, the recently developed electrical impedance tomography (EIT) system offers an image with reasonable resolution, but is complex and needs many electrodes. By placing two FEIM systems perpendicular to each other over a common zone at the center and combining the two results, it is possible to obtain enhanced sensitivity over this central zone. This is the basis of the proposed new method of focused impedance measurement (FIM). Sensitivity maps in both 2D and 3D show the desired improvement. A comparison of stomach‐emptying studies also indicates the improvement achieved. This new method may be useful for impedance measurements of large organs like stomach, heart, and lungs. Being much simpler in comparison to EIT, multifrequency systems can be simply built for FIM. Besides, FIM may have utility in other fields like geology where impedance measurements are performed.