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Scanning Transmission Electron Microscope (STEM) Elemental Mapping by Electron Energy‐Loss Spectroscopy
Author(s) -
LEAPMAN R. D.
Publication year - 1986
Publication title -
annals of the new york academy of sciences
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.712
H-Index - 248
eISSN - 1749-6632
pISSN - 0077-8923
DOI - 10.1111/j.1749-6632.1986.tb34539.x
Subject(s) - scanning transmission electron microscopy , library science , instrumentation (computer programming) , electron energy loss spectroscopy , physics , computer science , transmission electron microscopy , engineering physics , optics , operating system