Premium
OPTICAL COMPONENTS FOR X‐RAY MICROSCOPY
Author(s) -
Franks A.,
Gale B.,
Lindsey K.,
Pugh D. J.,
Robbie C. J.,
Stedman M.
Publication year - 1980
Publication title -
annals of the new york academy of sciences
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.712
H-Index - 248
eISSN - 1749-6632
pISSN - 0077-8923
DOI - 10.1111/j.1749-6632.1980.tb47218.x
Subject(s) - metrology , division (mathematics) , library science , engineering , physics , computer science , optics , mathematics , arithmetic