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THIN‐LAYER DRYING OF DATES
Author(s) -
HASSAN BAKRI H.,
HOBANI ALI I.
Publication year - 2000
Publication title -
journal of food process engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.507
H-Index - 45
eISSN - 1745-4530
pISSN - 0145-8876
DOI - 10.1111/j.1745-4530.2000.tb00510.x
Subject(s) - thin layer , exponential function , cultivar , moisture , diffusion , water content , function (biology) , diffusion equation , layer (electronics) , materials science , mathematics , composite material , thermodynamics , horticulture , physics , mathematical analysis , geology , biology , geotechnical engineering , economy , service (business) , evolutionary biology , economics
Thin‐layer drying rates of two date cultivars, namely, Sukkari and Sakie were experimentally determined at three drying temperatures 70, 80, and 90C. Three drying models were evaluated for the thin‐layer date data. These were the exponential model, Page equation, and the approximation of diffusion model. The Page equation fitted the data best. Two empirical expressions of Page equation for predicting moisture ratio as a function of drying time and drying temperature for the two date cultivars are presented.