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Genomic Distribution of Quantitative Trait Loci for Yield and Yield‐related Traits in Common Wheat
Author(s) -
Zhang LiYi,
Liu DongCheng,
Guo XiaoLi,
Yang WenLong,
Sun JiaZhu,
Wang DaoWen,
Zhang Aimin
Publication year - 2010
Publication title -
journal of integrative plant biology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.734
H-Index - 83
eISSN - 1744-7909
pISSN - 1672-9072
DOI - 10.1111/j.1744-7909.2010.00967.x
Subject(s) - quantitative trait locus , biology , family based qtl mapping , genetics , trait , locus (genetics) , gene , polygene , gene mapping , chromosome , computer science , programming language
A major objective of quantitative trait locus (QTL) studies is to find genes/markers that can be used in breeding programs via marker assisted selection (MAS). We surveyed the QTLs for yield and yield‐related traits and their genomic distributions in common wheat ( Triticum aestivum L.) in the available published reports. We then carried out a meta‐QTL (MQTL) analysis to identify the major and consistent QTLs for these traits. In total, 55 MQTLs were identified, of which 12 significant MQTLs were located on wheat chromosomes 1A, 1B, 2A, 2D, 3B, 4A, 4B, 4D and 5A. Our study showed that the genetic control of yield and its components in common wheat involved the important genes such as Rht and Vrn . Furthermore, several significant MQTLs were found in the chromosomal regions corresponding to several rice genomic locations containing important QTLs for yield related traits. Our results demonstrate that meta‐QTL analysis is a powerful tool for confirming the major and stable QTLs and refining their chromosomal positions in common wheat, which may be useful for improving the MAS efficiency of yield related traits.