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Processing and Dielectric Properties of TiO 2 Thick Films for High‐Energy Density Capacitor Applications
Author(s) -
Chao Sheng,
Dogan Fatih
Publication year - 2010
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2010.02592.x
Subject(s) - materials science , dielectric , slurry , tape casting , dispersant , composite material , capacitor , casting , rheology , sintering , energy density , engineering physics , electrical engineering , dispersion (optics) , optoelectronics , optics , voltage , physics , engineering
Nanosized titanium dioxide (TiO 2 ) powders (∼40 nm) were used for preparation of tape‐casting slurries. Effect of various solvents and dispersants on the dispersability of TiO 2 slurries was studied by sedimentation tests and rheology measurements. TiO 2 green tapes were prepared by tape‐casting method and densified at 1000°C with a sintered density >95%. Dielectric properties of TiO 2 tapes were studied by measuring of dielectric constant, loss factor and dielectric breakdown strength (BDS) with respect to their microstructural development. BDS values as high as ∼1400 kV/cm were obtained for sintered tapes so that energy densities up to 14 J/cm 3 could be achieved.