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Crystallographic Characteristics of Grain Boundaries in Dense Yttria‐Stabilized Zirconia
Author(s) -
Helmick Lam,
Dillon Shen J.,
Gerdes Kirk,
Gemmen Randall,
Rohrer Gregory S.,
Seetharaman Sridhar,
Salvador Paul A.
Publication year - 2011
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2010.02567.x
Subject(s) - misorientation , materials science , grain boundary , yttria stabilized zirconia , electron backscatter diffraction , crystallite , cubic zirconia , plane (geometry) , diffraction , crystallography , condensed matter physics , mineralogy , geometry , composite material , microstructure , ceramic , metallurgy , optics , geology , chemistry , mathematics , physics
Grain‐boundary plane, misorientation angle, grain size, and grain‐boundary energy distributions were quantified using electron backscatter diffraction data for dense polycrystalline yttria‐stabilized zirconia, to understand interfacial crystallography in solid oxide fuel cells. Tape‐cast samples were sintered at 1450°C for 4 h and annealed for at least 100 h between 800°C and 1650°C. Distributions obtained from both three‐dimensional (3D) reconstructions and stereological analyses of 2D sections demonstrated that the (100) boundary planes {(111)} have relative areas larger {smaller} than expected in a random distribution, and that the boundary plane distribution is inversely correlated to the boundary energy distribution.