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Control of Paste Rheology and Piezoelectric Properties of Bi 0.5 (Na 0.82 K 0.18 ) 0.5 TiO 3 Lead‐Free Piezoelectric Thick Films Deposited by Screen Printing
Author(s) -
Zhang Haibo,
Jiang Shenglin,
Kajiyoshi Koji
Publication year - 2011
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2010.02497.x
Subject(s) - materials science , piezoelectricity , composite material , dielectric , rheology , screen printing , piezoelectric coefficient , polarization (electrochemistry) , coercivity , optoelectronics , condensed matter physics , chemistry , physics
Bi 0.5 (Na 0.82 K 0.18 ) 0.5 TiO 3 (NKBT) lead‐free thick films with a thickness of 10–100 μm have been deposited on a Pt‐electroded alumina substrate using screen printing. The influences of the NKBT particle size, NKBT powder content, binder concentration, and dispersant on the rheological characteristics were systematically investigated. The resulting 60 μm thick films exhibit a dielectric constant of 582 (10 kHz), a dielectric loss of 2.8%, remanent polarization of 22.5 μC/cm 2 , a coercive field of 62 kV/cm, and a longitudinal effective piezoelectric coefficient, d 33eff of 91 pm/V. The thick films are expected to be a new and promising candidate for lead‐free piezoelectric microdevices especially the microactuator applications.