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Microwave Dielectric Properties of (Mg 1− x Ni x ) 2 TiO 4 ( x =0.02–0.1) Ceramics
Author(s) -
Huang ChengLiang,
Ho ChengEn
Publication year - 2010
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2010.02495.x
Subject(s) - materials science , solid solution , analytical chemistry (journal) , ceramic , ilmenite , dielectric , x ray crystallography , microwave , grain size , diffraction , mineralogy , metallurgy , optics , physics , optoelectronics , chemistry , chromatography , quantum mechanics
Low‐loss ceramics in the system (Mg 1− x Ni x ) 2 TiO 4 ( x =0.02–0.1) have been prepared using the conventional solid‐state ceramic route. The formation of (Mg 1− x Ni x ) 2 TiO 4 ( x =0.02–0.1) solid solutions was confirmed by the EDX analysis and the lattice parameters measured, which linearly varied from Mg 2 TiO 4 ( a = b = c =8.4410 Å) to (Mg 0.9 Ni 0.1 ) 2 TiO 4 ( a = b = c =8.4335 Å). The X‐ray diffraction analysis also confirmed the coexistence of a cubic‐structured (Mg 1− x Ni x ) 2 TiO 4 and an ilmenite‐structured second phase (Mg 1− x Ni x )TiO 3 . By increasing x , not only could the Q × f of the (Mg 1− x Ni x ) 2 TiO 4 solid solution be considerably increased from 150,000 GHz at x =0 to a maximum 238,000 GHz at x =0.05, the highest ɛ r ∼16.43 could also be obtained simultaneously. This was mainly due to the uniform grain morphology and the highest density of the specimen. A good combination of microwave dielectric properties (ɛ r ∼16.43, Q × f ∼238,000 GHz at 9.8 GHz, and τ f ∼−55 ppm/°C) can be achieved for a specimen using (Mg 0.95 Ni 0.05 ) 2 TiO 4 sintered at 1400°C for 4 h.