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Nondestructive Characterization of High‐Performance C/SiC‐Ceramics Using X‐Ray‐Computed Tomography
Author(s) -
Hausherr Jan Marcel,
Krenkel Walter,
Fischer Frank,
Altstädt Volker
Publication year - 2010
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2009.02449.x
Subject(s) - materials science , ceramic , characterization (materials science) , porosity , ceramic matrix composite , composite material , x ray , anisotropy , tomography , computed tomography , phase (matter) , optics , nanotechnology , medicine , chemistry , physics , organic chemistry , radiology
The quality control of ceramic matrix composites (CMC) has always been a challenge due to their anisotropy and inhomogeneity. Using high‐resolution X‐ray computed tomography, these materials can be analyzed in situ during the manufacturing process, providing a three‐dimensional analysis without damaging or modifying the samples. This paper analyzes the three material states CFRP, C/C and C/SiC that occur during the processing of melt‐infiltrated C/SiC composites and describes the changes in morphology occurring after each processing step. In addition, a quantitative porosity and phase‐analysis of the complete volume was performed.