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Synthesis, Structure Analysis, and Microwave Dielectric Properties of LnTiSb x Ta 1− x O 6 (Ln=Ce, Pr, and Nd) Ceramics
Author(s) -
Padma Kumar Hariharan,
Joseph Shyla,
Solomon Sam,
Varma Manoj Raama,
Thomas Jijimon Kumpukkatu
Publication year - 2008
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2008.02238.x
Subject(s) - materials science , ceramic , dielectric , microwave , dielectric resonator , scanning electron microscope , diffraction , resonator , microwave cavity , analytical chemistry (journal) , composite material , optics , optoelectronics , telecommunications , chemistry , physics , chromatography , computer science
LnTiSb x Ta 1− x O 6 ceramics were prepared by the conventional solid‐state ceramic route for x =0, 0.05, 0.1, 0.15, and 0.2. The structures of the materials were analyzed using X‐ray diffraction techniques. The cell parameters and the theoretical densities of the samples were calculated using least square methods. The materials are sintered to >94% of theoretical density at 1480°C. The microwave dielectric properties were measured using the cavity resonator method. The surface morphology of the sintered samples was analyzed using scanning electron microscopy. All the materials have good microwave dielectric properties and are suitable for dielectric resonator applications.