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Effect of Firing Temperature on Electrical and Gas‐Sensing Properties of Nano‐SnO 2 ‐Based Thick‐Film Resistors
Author(s) -
Garje Anil D.,
Aiyer Rohini C.
Publication year - 2007
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2007.02158.x
Subject(s) - materials science , tetragonal crystal system , resistor , orthorhombic crystal system , electrical resistivity and conductivity , atmospheric temperature range , analytical chemistry (journal) , screen printing , nano , phase (matter) , composite material , optoelectronics , nanotechnology , crystal structure , crystallography , electrical engineering , thermodynamics , chemistry , chromatography , voltage , physics , organic chemistry , engineering
Nano‐SnO 2 ‐based thick‐film resistors were fabricated using screen printing technology. To study the effect of firing temperature, sensors were fired in the range 425–850°C. A mixture of tetragonal and orthorhombic SnO 2 was observed in the range 425–700°C. Above 700°C, the presence of majority tetragonal phase was observed. The sheet resistivity and TCR values were one to two orders of magnitude less than the reported values. Sensors fired at 750°C showed the highest sensitivity and selectivity for H 2 , CO, and LPG at 140°C, 210°C, and 180°C, respectively, with a response and recovery time of 12 and 22 s.