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Temperature Dependence of Thermal Reflection Behavior of Al 2 O 3 –TiO 2 Multilayer Thermal Energy Window Coating
Author(s) -
Ikegami M.,
Matsumura K.,
Kagawa Y.,
Kamei M.
Publication year - 2006
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2006.02081.x
Subject(s) - materials science , sapphire , coating , reflection (computer programming) , thermal , wavelength , thermal radiation , sputtering , thermal oxidation , range (aeronautics) , energy (signal processing) , optics , thermal barrier coating , thermal energy , atmospheric temperature range , optoelectronics , composite material , thin film , layer (electronics) , nanotechnology , laser , thermodynamics , physics , computer science , programming language , statistics , mathematics
An Al 2 O 3 –TiO 2 multilayer‐coated sapphire thermal energy window coating has been fabricated using an ultra‐high‐speed vacuum sputtering method. Thermal reflection spectra of the coated material in the wavelength range from 1.43 to 3.33 μm are measured in ambient air at temperatures of 298, 773, and 1173 K. The result shows that the light reflectance of ∼70% is achieved using a layered structure and this performance continues up to 1173 K. Thermal reflection energy of the coated material at T =1173 K is estimated to be about three times higher than that of uncoated sapphire, suggesting the potential of this coating to control thermal radiation energy.

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