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Using X‐Ray Topography to Inspect Surfaces of Single‐Crystal Components
Author(s) -
Black David
Publication year - 2005
Publication title -
international journal of applied ceramic technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 57
eISSN - 1744-7402
pISSN - 1546-542X
DOI - 10.1111/j.1744-7402.2005.02028.x
Subject(s) - materials science , x ray , orientation (vector space) , synchrotron , diffraction , surface (topology) , optics , single crystal , x ray crystallography , crystal (programming language) , crystallography , synchrotron radiation , geometry , computer science , physics , programming language , chemistry , mathematics
X‐ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single‐crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The attributes of synchrotron‐based X‐ray topography as applied to inspection will be described and illustrated with examples from recent experiments.