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A new method for evaluating postacne scarring
Author(s) -
Lee Jin Woong,
Kim Beom Joon,
Kim Myeung Nam,
Choi YoungHwan,
Kim Kyungrok,
Hwang Eenjun
Publication year - 2012
Publication title -
skin research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.521
H-Index - 69
eISSN - 1600-0846
pISSN - 0909-752X
DOI - 10.1111/j.1600-0846.2011.00568.x
Subject(s) - medicine , dermatology , family medicine

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