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SIMS study of element concentration profiles in enamel and dentin
Author(s) -
FROSTELL G.,
LARSSON S. J.,
LODDING A.,
ODELIUS H.,
PETERSSON L. G.
Publication year - 1977
Publication title -
european journal of oral sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.802
H-Index - 93
eISSN - 1600-0722
pISSN - 0909-8836
DOI - 10.1111/j.1600-0722.1977.tb00526.x
Subject(s) - dentin , enamel paint , chemistry , dental enamel , analytical chemistry (journal) , table (database) , materials science , mineralogy , dentistry , composite material , chromatography , computer science , medicine , data mining
– The ion probe technique has been employed for the determination of the concentrations of P, F, Cl, C, Na, K, Mg, Sr, Al, and Si at different depths in human tooth. The applicability of the method depends selectively on the element's position in the periodic table, but may be regarded as good for a wide range of microelements of dental interest.