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Trace Element Analysis of Rough Diamond by LA‐ICP‐MS: A Case of Source Discrimination? * ,†
Author(s) -
Dalpé Claude,
Hudon Pierre,
Ballantyne David J.,
Williams Darrell,
Marcotte Denis
Publication year - 2010
Publication title -
journal of forensic sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.715
H-Index - 96
eISSN - 1556-4029
pISSN - 0022-1198
DOI - 10.1111/j.1556-4029.2010.01509.x
Subject(s) - diamond , analytical chemistry (journal) , impurity , materials science , linear discriminant analysis , inductively coupled plasma mass spectrometry , trace element , mass spectrometry , chemistry , computer science , metallurgy , artificial intelligence , chromatography , organic chemistry
Abstract: Current profiling of rough diamond source is performed using different physical and/or morphological techniques that require strong knowledge and experience in the field. More recently, chemical impurities have been used to discriminate diamond source and with the advance of laser ablation–inductively coupled plasma–mass spectrometry (LA‐ICP‐MS) empirical profiling of rough diamonds is possible to some extent. In this study, we present a LA‐ICP‐MS methodology that we developed for analyzing ultra‐trace element impurities in rough diamond for origin determination (“profiling”). Diamonds from two sources were analyzed by LA‐ICP‐MS and were statistically classified by accepted methods. For the two diamond populations analyzed in this study, binomial logistic regression produced a better overall correct classification than linear discriminant analysis. The results suggest that an anticipated matrix match reference material would improve the robustness of our methodology for forensic applications.