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Characterization of Domains Reorientation in Multilayer Piezoelectric Ceramic Actuators by Polarized Raman Spectroscopy
Author(s) -
Peng Bin,
Yue Zhenxing,
Meng Siqin,
Xi Xiaoqing,
Li Longtu
Publication year - 2012
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2012.05339.x
Subject(s) - poling , materials science , electric field , piezoelectricity , characterization (materials science) , ceramic , raman spectroscopy , composite material , actuator , stress (linguistics) , intensity (physics) , optics , ferroelectricity , dielectric , electrical engineering , optoelectronics , nanotechnology , physics , linguistics , philosophy , engineering , quantum mechanics
Polarized R aman spectroscopy was applied to characterize domains reorientation in the multilayer piezoelectric ceramic actuators during the poling process and in the near crack tip zone. It is found that the relative intensity of the vibration modes of E (2 TO ) and E (3 TO + 2 LO ) + B 1 ( I E(2TO) / I silent ) is affected by electric field and mechanical stress. During the poling process, I E(2TO) / I silent increases when the applied DC electric field exceeds the coercive electric field. In the near crack tip zone, the I E(2TO) / I silent mapping indicates that near the crack tip zone indicated that the domains were reoriented and the mapping of R aman shift of E (3 TO + 2 LO ) + B 1 mode reveals the stress release caused by crack development. This study also confirms that the relative intensity of I E(2TO) / I silent can be used for characterization of domains reorientation in PZT ‐based ceramics under electric and mechanical stresses.