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Chemically Driven Zero Shrinkage Dielectric Ceramics
Author(s) -
Choi Ik Jin,
Hong Kyung Pyo,
Jung Jae Woong,
Cho Yong Soo
Publication year - 2012
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2012.05197.x
Subject(s) - shrinkage , dielectric , materials science , ceramic , microstructure , composite material , mineralogy , chemistry , optoelectronics
A new approach of producing ~0% fired shrinkage of dielectric ceramics is introduced without using the known physically constraining interaction during firing. The combination of SiC and Al 2 O 3 fillers with a typical calcium aluminoborosilicate glass demonstrated the potential of generating nearly zero shrinkage, presumably from the chemical reaction between the glass and SiC above a critical temperature. The sample with zero shrinkage, as exemplified with the composition of 25 wt% SiC, 25 wt% Al 2 O 3 , and 50 wt% glass, does not produce fully dense microstructure, but shows acceptable values of k (dielectric constant) ~7.4 and tanδ ~0.004 at 1 MHz. The achievement of the least shrinkage is found to be sensitive to the relative content of SiC and firing temperature.