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Stress Development During the Co‐firing of Integrated Ferrite/Dielectric Laminates
Author(s) -
Tung YiLing,
Peng TeMing,
Jean JauHo,
Lin ShihChang
Publication year - 2012
Publication title -
journal of the american ceramic society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.9
H-Index - 196
eISSN - 1551-2916
pISSN - 0002-7820
DOI - 10.1111/j.1551-2916.2011.05003.x
Subject(s) - materials science , shrinkage , sintering , ferrite (magnet) , composite material , ceramic , dielectric , optoelectronics
Stress development during co‐firing a multilayer dielectric material of Bi 2 ( Zn 1/3 Nb 2/3 ) 2 O 7 ( BZN ) and magnetic material of ( Ni 0.3 Cu 0.1 Zn 0.6 O )‐( Fe 2 O 3 ) 0.8 ( NiCuZn ferrite) laminate has been investigated by measuring camber development and shrinkage rate difference. The trend of camber development follows a similar pattern to the linear shrinkage rate difference between NiCuZn ferrite and BZN . No co‐firing defects are observed in the multilayer structure of NiCuZn ferrite and BZN laminates, which is attributed to good sintering compatibility between these two ceramics, and the sintering mismatch stress generated in the laminate much less than those of sintering potentials.